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Additions to the Standard are made utilizing the SEMI Standards balloting process
Referenced SEMI StandardsSEMI M1 — Specifications for Polished Single Crystal Silicon Wafers
SEMI M49-0412 (technical revision)
The oxygen concentration obtained using this Test Method assumes a linear relationship between the interstitial oxygen concentration and the absorption coefficient of the 1107 cm1 band associated with interstitial oxygen in silicon
G04900 - SEMI G49 - Specification for Plastic Molding Preforms StdPbc-0425 Additions to the Standard areThis specification defines the physical requirements for preforms made with thermosetting molding compounds. Consistent preform quality enhances moldability and finished product reliability. Referenced SEMI Standards None.
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