PV04100 - SEMI PV41 - Test Method for In-Line, Noncontact Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications Using Capacitive Probes StdPbc-0724 This Document defines a method

This Document defines a method of testing the wetted surfaces of stainless steel tubing

It is the responsibility of the users of this standard to conform to the appropriate local codes and regulations as applied to this type of equipment

The purpose of this Document is to provide a guide for hafnium chloride for which a need has been identified

2  All metrics defined herein are applicable to equipment systems that include subsystems

PV04100 - SEMI PV41 - Test Method for In-Line, Noncontact Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications Using Capacitive Probes StdPbc-0724 This Document defines a methodWafer thickness and its variation across a wafer are important parameters for solar cell manufacturing. Excessive thickness variations within a lot from wafer to wafer or within a wafer may negatively impact process yield and solar cell efficiency. Both parameters are part of the specification for solar cell wafers (SEMI PV22), which define a thickness range as well as an upper limit for the total thickness variation (TTV). In addition, careful